Design of Pseudoexhaustive Testable PLA with Low Overhead

نویسندگان

  • Wen-Zen Shen
  • Gwo-Haur Hwang
  • Wen-Jun Hsu
  • Yun-Jung Jan
چکیده

The pseudoexhaustive testing (PET) scheme is a economic approach to test a large embedded programmable logic array (PLA). In this paper, we propose an efficient algorithm named low overhead PET (LOPET) to partition the product lines. By applying our algorithm, both the area overhead and test length are reduced significantly.

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عنوان ژورنال:
  • IEEE Trans. Computers

دوره 42  شماره 

صفحات  -

تاریخ انتشار 1993