Design of Pseudoexhaustive Testable PLA with Low Overhead
نویسندگان
چکیده
The pseudoexhaustive testing (PET) scheme is a economic approach to test a large embedded programmable logic array (PLA). In this paper, we propose an efficient algorithm named low overhead PET (LOPET) to partition the product lines. By applying our algorithm, both the area overhead and test length are reduced significantly.
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عنوان ژورنال:
- IEEE Trans. Computers
دوره 42 شماره
صفحات -
تاریخ انتشار 1993